Obsnap Instruments Sdn Bhd
29A, Jalan SS 15/4C, 47500 Subang Jaya, Selangor, Malaysia.
+603-5621 5786
+603-5621 5829
+60122185651 (Enquiry)
+60162233687 (Vacancy)
Mahr Metrology - MarSurf XR 1
| Previous | 10 / 18 | Next |
MarSurf XR 1. The ideal instrument for a low-cost introduction to user-friendly surface metrology.
The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for innovative roughness evaluation software.
- Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
- Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required
- Comprehensive measuring records
- Teach-in methods for the rapid creation of Quick&Easy measuring programs
- Automatic functions for choosing cut-off and traversing length in accordance with standards
- Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
- Adjustable maintenance and calibration intervals
- Multiple measuring station configurations for custom applications
- Range of options provide system flexibility
- Various user levels protect the device against misuse and prevent unauthorized people from using it
Technical Data
|
Measuring principle
|
Stylus method
|
|---|---|
|
Probe
|
BFW skidless system with MarSurf SD 26 drive unit and/or PHT skidded system with MarSurf RD 18 drive unit
|
|
Measuring range mm
|
+/- 250 µm (up to +/- 750 µm with 3x probe arm length) applies to BFW system
350 µm applies to PHT probe system |
|
Filter according to ISO/JIS
|
filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31
|
|
Traversing lengths
|
MarSurf GD 26 / SD 26: Automatic; 0.56 mm*; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,
Measurement up to stop, variable * Traversing length dependent on drive unit RD 18: Automatic; 1.75 mm; 5.6 mm; 17.5 mm |
|
Number n of sampling length according to ISO/JIS
|
1 to 50 (default: 5)
|
|
Measuring force (N)
|
0,75 mN
|
|
Surface parameters
|
Over 80 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
|
